LTT Labs conducted a high-resolution X-ray computed tomography (CT) scan of a delidded Intel Core i9-14900KS processor using an industrial 120 kV scanner. The 12-hour imaging process successfully mapped internal PCB layers, vias, and rear-mounted decoupling capacitors designed to manage high-frequency power transients. Furthermore, the scan revealed distinct internal silicon features, including performance (P) and efficiency (E) cores, central cache-and-bus routing, and integrated graphics blocks.
Key Points
Scanner Metrology: Utilized a Lumafield Neptune 120 kV industrial X-ray CT scanner with a 720-minute (12-hour) scan duration and a 2.5 mm copper filter for beam hardening.
Power Delivery Subsystem: Rear PCB capacitors supply localized energy and mitigate voltage noise for rapid, high-frequency current spikes demanded by transistors on the Intel 7 process node.
Silicon Architecture Mapping: Scan comparisons to actual die schematics clearly identified performance cores (P-cores), efficiency cores (E-cores), central cache and bus corridors, and peripheral integrated GPU and media engine circuitry.
Discussion Highlights
Imaging Capability Analysis: Commenters expressed surprise at the CT scan's ability to delineate internal core layouts, attributing the visibility to dense metal interconnect layers and localized power distribution footprints.
Publication Reception & Moderation: Community members praised the technical rigor of recent LTT Labs articles, while noting that automated submission filters on Hacker News occasionally suppress posts from specific staff members.