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Abstract:

This video features representatives from Zeiss Korea introducing various microscopy and inspection solutions relevant to battery research and manufacturing quality control. Jeong Jin discusses the use of optical and non-destructive X-ray microscopes for analyzing battery material microstructures and internal changes after cycling. Park Jeong-hwan presents an automated burr inspection system integrated with optical microscopes, capable of detecting defects down to 1 micrometer using specialized software. Cho Han introduces the Metrotom 100 CT scanner, highlighting its precision (VDI/VDE certified), its application in imaging components like the 4680 battery, and its technologies (LeLa, Scatter Control) for reducing scattering artifacts in complex materials. Finally, Oh Myeong-seok describes the ScanHawk 2, a portable, compact laser scanner with 20-micrometer precision suitable for versatile on-site product scanning.

Zeiss Korea Solutions for Battery Research and Quality Control

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