This video provides an extensive tour of the International Microwave Symposium (IMS) in San Francisco, showcasing a wide array of cutting-edge test and measurement solutions and innovations in the RF and microwave industry. The presenter highlights new product releases and advancements from prominent companies such as Rohde & Schwarz, Keysight, Samtec, MPI, Zurich Instruments, Z-Communications, Focus Microwaves, Siglent, Leapwave, Aravant, Signal Hound, Amcad Engineering, VDI, Transonics, and Microsanj. The key focus areas include advanced multi-port spectrum and network analyzers, high-frequency characterization systems, novel noise analysis techniques, high-power solutions, new material applications like glass substrates, and highly integrated, often portable, test systems for complex device characterization and production environments.
Key Innovations from IMS 2023:
0:33 Rohde & Schwarz FSWX: A new 2-port spectrum analyzer featuring a unique LO architecture for independent frequency analysis. It utilizes correlation functions for significant noise removal and improved linearity, supporting direct digitization up to 8 GHz for enhanced spur and dynamic range.
3:54 Rohde & Schwarz ZNB 3000: A 4-channel Vector Network Analyzer (VNA) offering up to 26.5 GHz frequency range and 160 dB dynamic range. Demonstrated for high-power stress testing of filters and ultra-rapid multi-port measurements (thousands of S-parameters in under a second) on complex devices like beamformers, integrated with solid-state switch matrices.
6:47 Rohde & Schwarz FSWP: A revamped phase noise analyzer with integrated sources up to 56 GHz (for inherent phase noise) and 54 GHz (for additive phase noise with external devices). It can indirectly measure noise figure and supports external source locking for highly precise measurements.
9:49 Rohde & Schwarz NGT Power Supply: An unreleased, ultra-high power (1800W per channel) 2-channel power supply designed for stacking and synchronization to deliver even higher outputs for demanding applications.
10:50 Rohde & Schwarz Nearfield Farfield Measurement Chamber: An expanded chamber featuring multiple reflectors, enabling simultaneous multi-beam excitation and measurement. Itβs ideal for characterizing large-scale phase arrays in dynamic environments, with capabilities up to 170 GHz.
12:36 Samtec Glass Core Packaging (Nokia): Showcases Nokia's use of glass as a substrate material, rivaling semiconductor precision and enabling new performance metrics for high-frequency modules (hundreds of GHz) across wireless, optical, sensor, and radar applications due to its low loss.
14:15 Keysight Active Load Pull System: Combines an MXG 4-port instrument with a PXIe network analyzer to synthesize any impedance at the DUT output. It extracts EVM and nonlinear parameters, integrating with Keysight EDA tools for comprehensive amplifier modeling and simulation validation.
16:14 Keysight Radiation Pattern Measurement System: A turnkey over-the-air measurement solution that accurately brings the measurement plane to the DUT edge. It performs calibrated measurements of ERP, power, and nonlinearity (DBD) in the far-field, utilizing a VXG for high-bandwidth modulated excitation during beamforming.
17:56 Keysight PNAX Pro: Features a fundamentally new architecture with four independent sources and two independent low-noise receivers. This allows for advanced measurements like two-tone, memory effects, and IQ mixer characterization, with direct synthesis sources providing up to 6 GHz instantaneous bandwidth and a noise floor below -160 dB.
21:51 Keysight D-Band Characterization System: A live demonstration of simultaneous RF and baseband signal capture at 330-500 GHz. It employs IQ noise cancellation and coherent averaging to significantly improve EVM (e.g., from 3.5-4% down to 2%) and identify noise sources in high-frequency measurements.
24:43 MPI Terahertz Probe Stations: Presents both automated (TS3000) and manual (TS150) probe stations with innovations like temperature barriers, laminar airflow, and thermal guards. These features ensure repeatable, low-drift measurements by thermally isolating probe tips from high-frequency modules, alongside built-in mechanical safety features.
28:11 Zurich Instruments Lock-in Amplifier (SHI): Operates up to 8.5 GHz with eight modulators/demodulators, eliminating the need for traditional external down/up converters, thereby reducing measurement uncertainty and setup time for applications in quantum and materials science.
29:39 Z-Communications Smart PLLs: New compact, fully shielded modules controlled via Bluetooth/USB-C, featuring built-in amplifiers, phase synchronization, and lock detection. They offer a wide frequency range (45 MHz to 22.6 GHz) as a convenient, portable alternative to traditional synthesizers.
31:38 Focus Microwaves G-Band Noise Characterization System: Provides significantly improved repeatability and precision for noise figure measurements at G-Band (110-170 GHz) by integrating tuners, switches, and noise sources for automated S-parameter calibration and noise parameter extraction.
33:04 Focus Microwaves Rapid Load Pull System: An active load pull system based on Keysight PXI, generating custom modulated waveforms to simulate the entire Smith chart. It rapidly computes contours for EVM, ACPR, and power, offering a comprehensive characterization far faster than traditional simulation methods.
36:12 Siglent Handheld Devices and SNA 6000 Series: Showcases a portfolio of portable instruments, including 2-port VNAs (up to 26.5 GHz) with spectrum monitors, and real-time spectrum analyzers (up to 12 GHz, expanding to 26.5 GHz) with network analyzer functions. Also highlights the SNA 6000 VNA's multi-port capabilities via a switch matrix.
38:14 Leapwave Broadband Signal Generation/Detection: Introduces a new technology for generating ultra-broadband signals (DC to 500 GHz) by mixing two DFB lasers on a photodetector, enabling applications in instrumentation and coherent detection through unique high-frequency transitions.
39:54 Flexible Waveguide: An innovative dielectric waveguide design offering exceptionally low loss (3-4 dB for 600mm at D-band, 110-170 GHz) despite its flexibility, making it ideal for unusual or moving connections while maintaining high signal integrity.
41:03 Spinner Traceable Calibration Kit: The only .8mm traceable calibration kit available, operating up to 167 GHz. It is crucial for calibrating coaxial interfaces in high-speed coherent optics and next-generation optical devices, ensuring measurement traceability.
42:07 Aravon Synthesizer and Multipliers: Presents a standalone 22 GHz synthesizer and compact E-band (60-90 GHz) multipliers with built-in calibration, isolators, and antennas. It also features upgraded E-band remote heads (67-116 GHz) that offer a competitive, lower-cost solution.
43:54 Signal Hound Real-time Spectrum Analyzer and VNA: Highlights the SM200C/SM435C (20 GHz real-time spectrum analyzer) and a new 20 GHz vector signal generator with free software. It introduces a cross-correlation based phase noise analyzer (down to -180 dBc) and a highly portable 40 GHz 2-port VNA powered solely by a single USB port.
47:09 Amcad Engineering RF Pulse IV Characterization: Combines load pull with RF pulse IV characterization to apply RF pulses that emulate real signal envelopes and load conditions, capturing dynamic behavior and trap effects in devices for validation and neural network modeling.
48:31 VDI High Frequency Systems: Continues to push system measurements to extremely high frequencies (330-500 GHz) with high modulation bandwidths (e.g., 72 Gbps, sub-1% EVM). Features new ultra-high power TR headsets (1-watt output at 90-140 GHz) critical for compressing amplifiers and maintaining dynamic range in high-frequency S-parameter measurements.
52:26 Transonics Clean Power Filter: A tiny, proprietary ceramic-organic filter designed to eliminate noise and harmonics from DC/DC converters (up to 6V, 5A), preventing signal upconversion and providing clean power for sensitive RF systems.
54:16 Microsanj Thermal Reflectivity Systems: Leverages precise thermal measurements to detect circuit flaws and disconnections. By exciting circuit traces and analyzing minute thermal reactions, it provides a unique method for identifying physical problems through their thermal signatures.